Built In Test for VLSI: Pseudorandom Techniques - Bardell, Paul H. (IBM Corporation, Armonk, NY) - Books - John Wiley & Sons Inc - 9780471624639 - December 2, 1987
In case cover and title do not match, the title is correct

Built In Test for VLSI: Pseudorandom Techniques

Bardell, Paul H. (IBM Corporation, Armonk, NY)

Price
£ 210.99

Ordered from remote warehouse

Expected delivery Dec 9 - 18
Christmas presents can be returned until 31 January

Our customers say:

14-day return policy in accordance with European consumer protection law
Top ranking on Trustpilot
Add to your iMusic wish list

Built In Test for VLSI: Pseudorandom Techniques

Presents the major concepts, techniques, problems and solutions in the emerging field of pseudorandom pattern testing. The intention of this book is to present the material in a unified manner, making it a useful source for practising professionals and students.

368 pages, Ill.

Media Books     Hardcover Book   (Book with hard spine and cover)
Released December 2, 1987
ISBN13 9780471624639
Publishers John Wiley & Sons Inc
Pages 368
Dimensions 165 × 240 × 23 mm   ·   610 g

See all of Bardell, Paul H. (IBM Corporation, Armonk, NY) ( e.g. Hardcover Book )