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Conductive Atomic Force Microscopy: Applications in Nanomaterials
M Lanza
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Conductive Atomic Force Microscopy: Applications in Nanomaterials
M Lanza
The first book to summarize the applications of CAFM as the most important method in the study of electronic properties of materials and devices at the nanoscale.
400 pages
| Media | Books Hardcover Book (Book with hard spine and cover) |
| Released | October 11, 2017 |
| ISBN13 | 9783527340910 |
| Publishers | Wiley-VCH Verlag GmbH |
| Pages | 384 |
| Dimensions | 251 × 176 × 25 mm · 978 g |
| Language | English |
| Editor | Lanza, Mario |
See all of M Lanza ( e.g. Hardcover Book )