Nanometer-scale Defect Detection Using Polarized Light - Dahoo, Pierre-Richard (University of Versailles Saint-Quentin, France) - Books - ISTE Ltd and John Wiley & Sons Inc - 9781848219366 - August 12, 2016
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Dahoo, Pierre-Richard (University of Versailles Saint-Quentin, France)
Nanometer-scale Defect Detection Using Polarized Light

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This book describes the methods used to detect material defects at the nanoscale. The authors present different theories, polarization states and interactions of light with matter, in particular optical techniques using polarized light.

316 pages, black & white illustrations

Media Books     Hardcover Book   (Book with hard spine and cover)
Released August 12, 2016
ISBN13 9781848219366
Publishers ISTE Ltd and John Wiley & Sons Inc
Pages 320
Dimensions 165 × 241 × 23 mm   ·   612 g

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