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Nanometrology Using Transmission Electron Microscopy
Vlad Stolojan
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Nanometrology Using Transmission Electron Microscopy
Vlad Stolojan
The Transmission Electron Microscope (TEM) is the ultimate tool to see and measure structures on the nanoscale and to probe their elemental composition and electronic structure with sub-nanometer spatial resolution. This book is a practical guide for scientists who need to use the TEM as a tool to answer questions about physical and chemical phenomena on the nanoscale.
85 pages, colour illustrations
| Media | Books Paperback Book (Book with soft cover and glued back) |
| Released | October 12, 2015 |
| ISBN13 | 9781681740560 |
| Publishers | Morgan & Claypool Publishers |
| Pages | 85 |
| Dimensions | 178 × 256 × 10 mm · 136 g |
