Advances in Optics of Charged Particle Analyzers: Part 1 - Advances in Imaging and Electron Physics - - Books - Elsevier Science Publishing Co Inc - 9780443297861 - November 25, 2024
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Advances in Optics of Charged Particle Analyzers: Part 1 - Advances in Imaging and Electron Physics

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Advances in Optics of Charged Particle Analyzers: Part 1 - Advances in Imaging and Electron Physics

232 pages

Media Books     Hardcover Book   (Book with hard spine and cover)
To be released November 25, 2024
ISBN13 9780443297861
Publishers Elsevier Science Publishing Co Inc
Pages 232
Dimensions 497 g   (Weight (estimated))
Series Editor Hawkes, Peter W. (Founder-President of the European Microscopy Society and Fellow, Microscopy and Optical Societies of America; member of the editorial boards of several microscopy journals and Serial Editor, Advances in Electron Optics, France)
Series Editor Hytch, Martin (Senior Scientist, French National Centre for Research (CNRS), Toulouse, France)